Springer Series in Materials Science

Atom Probe Microscopy

Authors: Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P.

  • Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques
  • Presents a detailed description of the analysis tools
  • Includes practical examples of how the technique can be used in materials science research
  • Stands as a must-have reference for any user of atom probe microscopy
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eBook $119.00
price for USA (gross)
  • ISBN 978-1-4614-3436-8
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA
  • ISBN 978-1-4614-3435-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA
  • ISBN 978-1-4899-8939-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.


Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Reviews

“Atom Probe Microscopy … provides a much needed update on the topic and introduces the broader scientific community to this developing technique. … this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory.” (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)


Table of contents (10 chapters)

  • Introduction

    Gault, Baptiste (et al.)

    Pages 3-7

  • Field Ion Microscopy

    Gault, Baptiste (et al.)

    Pages 9-28

  • From Field Desorption Microscopy to Atom Probe Tomography

    Gault, Baptiste (et al.)

    Pages 29-68

  • Specimen Preparation

    Gault, Baptiste (et al.)

    Pages 71-110

  • Experimental Protocols in Field Ion Microscopy

    Gault, Baptiste (et al.)

    Pages 111-120

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-1-4614-3436-8
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA
  • ISBN 978-1-4614-3435-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA
  • ISBN 978-1-4899-8939-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Atom Probe Microscopy
Authors
Series Title
Springer Series in Materials Science
Series Volume
160
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4614-3436-8
DOI
10.1007/978-1-4614-3436-8
Hardcover ISBN
978-1-4614-3435-1
Softcover ISBN
978-1-4899-8939-0
Series ISSN
0933-033X
Edition Number
1
Number of Pages
XXIV, 396
Topics