Nanostructure Science and Technology

Modeling Nanoscale Imaging in Electron Microscopy

Editors: Vogt, Thomas, Dahmen, Wolfgang, Binev, Peter (Eds.)

  • Focuses solely on the modeling of microscopy, not the instrumentation
  • First book in the field since 1998
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eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-2191-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4614-2190-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-9728-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

About the authors

Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina.

Wolfgang Dahmen is a professor at RWTH Aachen.

Peter G. Binev is a Professor of Mathematics at the University of South Carolina.



Reviews

From the reviews:

“In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. … That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy.” (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)


Table of contents (6 chapters)

  • Kantianism at the Nano-scale

    Dickson, Michael

    Pages 1-9

  • The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems

    Browning, N. D. (et al.)

    Pages 11-40

  • High Resolution ExitWave Restoration

    Haigh, Sarah J. (et al.)

    Pages 41-72

  • Compressed Sensing and Electron Microscopy

    Binev, Peter (et al.)

    Pages 73-126

  • High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

    Binev, Peter (et al.)

    Pages 127-145

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-2191-7
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4614-2190-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-9728-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Modeling Nanoscale Imaging in Electron Microscopy
Editors
  • Thomas Vogt
  • Wolfgang Dahmen
  • Peter Binev
Series Title
Nanostructure Science and Technology
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4614-2191-7
DOI
10.1007/978-1-4614-2191-7
Hardcover ISBN
978-1-4614-2190-0
Softcover ISBN
978-1-4899-9728-9
Series ISSN
1571-5744
Edition Number
1
Number of Pages
IX, 182
Topics