Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Authors: Shen, Ruijing, Tan, Sheldon X.-D., Yu, Hao

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity
  • Presents analysis of each algorithm with practical applications in the context of real circuit design
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented
see more benefits

Buy this book

eBook $99.00
price for USA (gross)
  • ISBN 978-1-4614-0788-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-1-4614-0787-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-1-4899-8787-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
About this book

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

Table of contents (17 chapters)

  • Introduction

    Shen, Ruijing (et al.)

    Pages 3-14

  • Fundamentals of Statistical Analysis

    Shen, Ruijing (et al.)

    Pages 15-36

  • Traditional Statistical Leakage Power Analysis Methods

    Shen, Ruijing (et al.)

    Pages 39-54

  • Statistical Leakage Power Analysis by Spectral Stochastic Method

    Shen, Ruijing (et al.)

    Pages 55-63

  • Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling

    Shen, Ruijing (et al.)

    Pages 65-82

Buy this book

eBook $99.00
price for USA (gross)
  • ISBN 978-1-4614-0788-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-1-4614-0787-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-1-4899-8787-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Authors
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4614-0788-1
DOI
10.1007/978-1-4614-0788-1
Hardcover ISBN
978-1-4614-0787-4
Softcover ISBN
978-1-4899-8787-7
Edition Number
1
Number of Pages
XXX, 306
Topics