Integrated Circuits and Systems

Predictive Technology Model for Robust Nanoelectronic Design

Authors: Cao, Yu

  • Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks
  • Includes a complete and quantitative vision on the opportunities and limits of technology scaling toward the 10nm regime Addresses the emergent modeling and design needs under ever-increasing variability and reliability concerns
  • Covers state-of-the-art compact modeling solutions for CMOS alternatives and post-silicon devices, enabling exploratory design activities beyond traditional CMOS Discusses the seamless integration of the process/materials development and circuit simulation that supports concurrent technology-design research
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eBook $109.00
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  • ISBN 978-1-4614-0445-3
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Hardcover $149.00
price for USA
  • ISBN 978-1-4614-0444-6
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  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
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  • ISBN 978-1-4614-3021-6
  • Free shipping for individuals worldwide
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About this book

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Table of contents (10 chapters)

  • Introduction

    Cao, Yu

    Pages 1-6

  • Predictive Technology Model of Conventional CMOS Devices

    Cao, Yu

    Pages 7-23

  • Predictive Technology Model of Enhanced CMOS Devices

    Cao, Yu

    Pages 25-41

  • Statistical Extraction and Modeling of CMOS Variability

    Cao, Yu

    Pages 43-66

  • Modeling of Temporal Reliability Degradation

    Cao, Yu

    Pages 67-80

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-1-4614-0445-3
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4614-0444-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4614-3021-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Predictive Technology Model for Robust Nanoelectronic Design
Authors
Series Title
Integrated Circuits and Systems
Copyright
2011
Publisher
Springer US
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4614-0445-3
DOI
10.1007/978-1-4614-0445-3
Hardcover ISBN
978-1-4614-0444-6
Softcover ISBN
978-1-4614-3021-6
Series ISSN
1558-9412
Edition Number
1
Number of Pages
XV, 173
Topics