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  • © 2013

Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

  • Describes the latest developments in nonlinear methods and their application in fault diagnosis
  • Discusses in detail several advances in machine learning theory
  • Contains numerous case studies with real-world data from industry

Part of the book series: Advances in Computer Vision and Pattern Recognition (ACVPR)

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-xix
  2. Introduction

    • Chris Aldrich, Lidia Auret
    Pages 1-15
  3. Overview of Process Fault Diagnosis

    • Chris Aldrich, Lidia Auret
    Pages 17-70
  4. Artificial Neural Networks

    • Chris Aldrich, Lidia Auret
    Pages 71-115
  5. Statistical Learning Theory and Kernel-Based Methods

    • Chris Aldrich, Lidia Auret
    Pages 117-181
  6. Tree-Based Methods

    • Chris Aldrich, Lidia Auret
    Pages 183-220
  7. Fault Diagnosis in Steady-State Process Systems

    • Chris Aldrich, Lidia Auret
    Pages 221-279
  8. Dynamic Process Monitoring

    • Chris Aldrich, Lidia Auret
    Pages 281-339
  9. Process Monitoring Using Multiscale Methods

    • Chris Aldrich, Lidia Auret
    Pages 341-369
  10. Back Matter

    Pages 371-374

About this book

This unique text/reference describes in detail the latest advances in unsupervised process monitoring and fault diagnosis with machine learning methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections. Topics and features: discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

Reviews

From the reviews:

“The text elaborates a range of classifiers used for supervised and unsupervised machine learning methods, for different types of processes. … The rich examples of various industrial processes and the illustration of subsequent simulation results qualify the work as a reference textbook for graduate studies in machine learning.” (C. K. Raju, Computing Reviews, October, 2013)

Authors and Affiliations

  • Western Australian School of Mines, Curtin University, Perth, Australia

    Chris Aldrich

  • Department of Process Engineering, University of Stellenbosch, Stellenbosch, South Africa

    Lidia Auret

Bibliographic Information

  • Book Title: Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

  • Authors: Chris Aldrich, Lidia Auret

  • Series Title: Advances in Computer Vision and Pattern Recognition

  • DOI: https://doi.org/10.1007/978-1-4471-5185-2

  • Publisher: Springer London

  • eBook Packages: Computer Science, Computer Science (R0)

  • Copyright Information: Springer-Verlag London 2013

  • Hardcover ISBN: 978-1-4471-5184-5Published: 09 July 2013

  • Softcover ISBN: 978-1-4471-7160-7Published: 23 August 2016

  • eBook ISBN: 978-1-4471-5185-2Published: 15 June 2013

  • Series ISSN: 2191-6586

  • Series E-ISSN: 2191-6594

  • Edition Number: 1

  • Number of Pages: XIX, 374

  • Number of Illustrations: 57 b/w illustrations, 151 illustrations in colour

  • Topics: Artificial Intelligence

Buy it now

Buying options

eBook USD 99.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 129.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 179.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access