Information Modeling for Interoperable Dimensional Metrology

Authors: Zhao, Y., Kramer, T., Brown, R., Xu, X.

  • Gives readers an overview and in-depth understanding of a complete dimensional metrology system
  • Enables readers to utilize basic theories and key technologies to solve the practical dimensional measurement problems in modern dimensional metrology practices
  • Allows readers to integrate the information modeling techniques and data models described in the book with their own research work
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  • ISBN 978-1-4471-2167-1
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Hardcover $159.00
price for USA
valid through November 5, 2017
  • ISBN 978-1-4471-2166-4
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Softcover $159.00
price for USA
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  • ISBN 978-1-4471-6029-8
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Rent the eBook  
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About this book

Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity.

Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems.

Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices. 

Table of contents (9 chapters)

  • Introduction

    Zhao, Yaoyao (Fiona) (et al.)

    Pages 1-19

  • Practices of Information Modeling

    Zhao, Yaoyao (Fiona) (et al.)

    Pages 21-52

  • Product Definition and Dimensional Metrology Systems

    Zhao, Yaoyao (Fiona) (et al.)

    Pages 53-118

  • High-Level Dimensional Metrology Process Planning

    Zhao, Yaoyao (Fiona) (et al.)

    Pages 119-164

  • Low-Level Dimensional Metrology Process Planning and Execution

    Zhao, Yaoyao (Fiona) (et al.)

    Pages 165-207

Buy this book

eBook $119.00
price for USA (gross)
valid through November 5, 2017
  • ISBN 978-1-4471-2167-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.00
price for USA
valid through November 5, 2017
  • ISBN 978-1-4471-2166-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.00
price for USA
valid through November 5, 2017
  • ISBN 978-1-4471-6029-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the eBook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Information Modeling for Interoperable Dimensional Metrology
Authors
Copyright
2011
Publisher
Springer-Verlag London
Copyright Holder
Springer-Verlag London Limited
eBook ISBN
978-1-4471-2167-1
DOI
10.1007/978-1-4471-2167-1
Hardcover ISBN
978-1-4471-2166-4
Softcover ISBN
978-1-4471-6029-8
Edition Number
1
Number of Pages
XIX, 367
Topics