Test and Diagnosis for Small-Delay Defects

Authors: Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

  • Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects
  • Presents effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies
  • Details how to use timing information for small-delay defect diagnosis in order to increase the resolution of the diagnosis flow
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About this book

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

About the authors

This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
 
This book presents new techniques and methodologies to improve overall SDD detection with very small pattern sets. These methods can result in pattern counts as low as a traditional 1-detect pattern set and long path sensitization and SDD detection similar to or even better than n-detect or timing-aware pattern sets. The important design parameters and pattern-induced noises such as process variations, power supply noise (PSN) and crosstalk are taken into account in the methodologies presented. A diagnostic flow is also presented to identify whether the failure is caused by PSN, crosstalk, or a combination of these two effects.

  • Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects;
  • Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies;
  • Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow. 

 
 


 

Table of contents (11 chapters)

  • Introduction to VLSI Testing

    Tehranipoor, Mohammad (et al.)

    Pages 1-19

  • Delay Test and Small-Delay Defects

    Tehranipoor, Mohammad (et al.)

    Pages 21-36

  • Long Path-Based Hybrid Method

    Tehranipoor, Mohammad (et al.)

    Pages 37-60

  • Process Variations- and Crosstalk-Aware Pattern Selection

    Tehranipoor, Mohammad (et al.)

    Pages 61-82

  • Power Supply Noise- and Crosstalk-Aware Hybrid Method

    Tehranipoor, Mohammad (et al.)

    Pages 83-104

Buy this book

eBook $119.00
price for USA (gross)
  • ISBN 978-1-4419-8297-1
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $159.99
price for USA
  • ISBN 978-1-4419-8296-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.99
price for USA
  • ISBN 978-1-4899-8952-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the eBook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Test and Diagnosis for Small-Delay Defects
Authors
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-8297-1
DOI
10.1007/978-1-4419-8297-1
Hardcover ISBN
978-1-4419-8296-4
Softcover ISBN
978-1-4899-8952-9
Edition Number
1
Number of Pages
XVIII, 212
Topics