Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Editors: Nicolaidis, Michael (Ed.)

  • Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics

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eBook $159.00
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  • ISBN 978-1-4419-6993-4
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  • Immediate eBook download after purchase
Hardcover $209.00
price for USA
  • ISBN 978-1-4419-6992-7
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  • Usually dispatched within 3 to 5 business days.
Softcover $209.00
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  • ISBN 978-1-4614-2689-9
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  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
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About this book

Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.

Table of contents (10 chapters)

  • Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends

    Heijmen, Tino

    Pages 1-25

  • Single Event Effects: Mechanisms and Classification

    Gaillard, RĂ©mi

    Pages 27-54

  • JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors

    Slayman, Charles

    Pages 55-76

  • Gate Level Modeling and Simulation

    Buard, Nadine (et al.)

    Pages 77-102

  • Circuit and System Level Single-Event Effects Modeling and Simulation

    Alexandrescu, Dan

    Pages 103-140

Buy this book

eBook $159.00
price for USA (gross)
  • ISBN 978-1-4419-6993-4
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $209.00
price for USA
  • ISBN 978-1-4419-6992-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $209.00
price for USA
  • ISBN 978-1-4614-2689-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Soft Errors in Modern Electronic Systems
Editors
  • Michael Nicolaidis
Series Title
Frontiers in Electronic Testing
Series Volume
41
Copyright
2011
Publisher
Springer US
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-6993-4
DOI
10.1007/978-1-4419-6993-4
Hardcover ISBN
978-1-4419-6992-7
Softcover ISBN
978-1-4614-2689-9
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XVIII, 318
Topics