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  • Textbook
  • © 2011

X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology

  • No other volume examining recently technological advances of XRF for archaeological uses
  • Contributors are archaeologists, geologists, chemists and physicists
  • Guidance with this technology is invaluable for those working at historically or culturally sensitive sites where non-destructive analysis of archaeological materials is imperative
  • Includes supplementary material: sn.pub/extras

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Table of contents (10 chapters)

  1. Front Matter

    Pages i-xiv
  2. Factors Affecting the Energy-Dispersive X-Ray Fluorescence (EDXRF) Analysis of Archaeological Obsidian

    • M. Kathleen Davis, Thomas L. Jackson, M. Steven Shackley, Timothy Teague, Joachim H. Hampel
    Pages 45-63
  3. Non-destructive EDXRF Analyses of Archaeological Basalts

    • Steven P. Lundblad, Peter R. Mills, Arian Drake-Raue, Scott Kekuewa Kikiloi
    Pages 65-79
  4. Non-destructive Applications of Wavelength XRF in Obsidian Studies

    • Annamaria De Francesco, M. Bocci, G. M. Crisci
    Pages 81-107
  5. Back Matter

    Pages 203-231

About this book

Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.

Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide.

The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems.  It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.

Editors and Affiliations

  • Dept. Anthropology, University of California, Berkeley, Berkeley, USA

    M. Steven Shackley

About the editor

M. Steven Shackley is Professor of Anthropology and Director of the Berkeley Archaeological XRF Laboratory at the University of California, Berkeley.

Bibliographic Information

  • Book Title: X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology

  • Editors: M. Steven Shackley

  • DOI: https://doi.org/10.1007/978-1-4419-6886-9

  • Publisher: Springer New York, NY

  • eBook Packages: Humanities, Social Sciences and Law, Social Sciences (R0)

  • Copyright Information: Springer Science+Business Media, LLC 2011

  • Hardcover ISBN: 978-1-4419-6885-2

  • Softcover ISBN: 978-1-4614-3620-1

  • eBook ISBN: 978-1-4419-6886-9

  • Edition Number: 1

  • Number of Pages: XIV, 231

  • Number of Illustrations: 21 b/w illustrations, 11 illustrations in colour

  • Topics: Archaeology, Mass Spectrometry, Geology

Buy it now

Buying options

eBook USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 54.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access