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X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology

Editors: Shackley, M. Steven (Ed.)

  • No other volume examining recently technological advances of XRF for archaeological uses.
  • Contributors are archaeologists, geologists, chemists and physicists
  • Provides invaluable guidance to the technology, pertinent for those working at historically or culturally sensitive sites where non-destructive analysis of archaeological materials is imperative
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Buy this book

eBook $54.99
price for USA (gross)
  • ISBN 978-1-4419-6886-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-1-4419-6885-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $69.95
price for USA
  • ISBN 978-1-4614-3620-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this Textbook

Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.

Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide.

The contributors to this volume are at the forefront of the newest applications of XRF to archaeological solutions.  It covers all relevant aspects of the field for those using the newest XRF technologies.

About the authors

M. Steven Shackley is Professor of Anthropology and Director of the Berkeley Archaeological XRF Laboratory at the University of California, Berkeley.

Table of contents (10 chapters)

  • X-Ray Fluorescence Spectrometry in Twenty-First Century Archaeology

    Shackley, M. Steven

    Pages 1-6

  • An Introduction to X-Ray Fluorescence (XRF) Analysis in Archaeology

    Shackley, M. Steven

    Pages 7-44

  • Factors Affecting the Energy-Dispersive X-Ray Fluorescence (EDXRF) Analysis of Archaeological Obsidian

    Davis, M. Kathleen (et al.)

    Pages 45-63

  • Non-destructive EDXRF Analyses of Archaeological Basalts

    Lundblad, Steven P. (et al.)

    Pages 65-79

  • Non-destructive Applications of Wavelength XRF in Obsidian Studies

    Francesco, Annamaria (et al.)

    Pages 81-107

Buy this book

eBook $54.99
price for USA (gross)
  • ISBN 978-1-4419-6886-9
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-1-4419-6885-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $69.95
price for USA
  • ISBN 978-1-4614-3620-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology
Editors
  • M. Steven Shackley
Copyright
2011
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-6886-9
DOI
10.1007/978-1-4419-6886-9
Hardcover ISBN
978-1-4419-6885-2
Softcover ISBN
978-1-4614-3620-1
Edition Number
1
Number of Pages
XIV, 231
Number of Illustrations and Tables
21 b/w illustrations, 11 illustrations in colour
Topics