Process Variations and Probabilistic Integrated Circuit Design

Editors: Dietrich, Manfred, Haase, Joachim (Eds.)

  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process
  • Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design
  • Describes critical effects of process variation using simple examples that can be reproduced by the reader
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  • ISBN 978-1-4419-6621-6
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  • ISBN 978-1-4419-6620-9
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  • ISBN 978-1-4899-8860-7
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About this book

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Table of contents (6 chapters)

  • Introduction

    Haase, Joachim (et al.)

    Pages 1-10

  • Physical and Mathematical Fundamentals

    Lemaitre, Bernd (et al.)

    Pages 11-67

  • Examination of Process Parameter Variations

    Acar, Emrah (et al.)

    Pages 69-89

  • Methods of Parameter Variations

    Knoth, Christoph (et al.)

    Pages 91-179

  • Consequences for Circuit Design and Case Studies

    Bonnoit, Alyssa C. (et al.)

    Pages 181-213

Buy this book

eBook $99.00
price for USA (gross)
  • ISBN 978-1-4419-6621-6
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $129.00
price for USA
  • ISBN 978-1-4419-6620-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $129.00
price for USA
  • ISBN 978-1-4899-8860-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Rent the ebook  
  • Rental duration: 1 or 6 month
  • low-cost access
  • online reader with highlighting and note-making option
  • can be used across all devices
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Bibliographic Information

Bibliographic Information
Book Title
Process Variations and Probabilistic Integrated Circuit Design
Editors
  • Manfred Dietrich
  • Joachim Haase
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-6621-6
DOI
10.1007/978-1-4419-6621-6
Hardcover ISBN
978-1-4419-6620-9
Softcover ISBN
978-1-4899-8860-7
Edition Number
1
Number of Pages
XVI, 252
Topics