Integrated Circuits and Systems

Extreme Statistics in Nanoscale Memory Design

Editors: Singhee, Amith, Rutenbar, Rob A. (Eds.)

  • Includes a treatment of memory design from the perspective of statistical analysis
  • Covers relevant theoretical background from other fields: statistics, machine learning, optimization, reliability
  • Explains the problem of estimating statistics of memory performance variation
  • Shows solutions recently proposed in the Electronic Design Automation (EDA) community
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eBook $139.00
price for USA (gross)
  • ISBN 978-1-4419-6606-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-1-4419-6605-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • ISBN 978-1-4614-2672-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme statistics in nanoscale memories. The work covers a variety of techniques, including statistical, deterministic, model-based and non-parametric methods, along with relevant description of the sources of variations and their impact on devices and memory design. Specifically, the authors cover methods from extreme value theory, Monte Carlo simulation, reliability modeling, direct memory margin computation and hypervolume computation. Ideas are also presented both from the perspective of an EDA practitioner and a memory designer to provide a comprehensive understanding of the state-of -the-art in the area of extreme statistics estimation and statistical memory design. Extreme Statistics in Nanoscale Memory Design is a useful reference on statistical design of integrated circuits for researchers, engineers and professionals.

Table of contents (8 chapters)

  • Introduction

    Singhee, Amith

    Pages 1-8

  • Extreme Statistics in Memories

    Singhee, Amith

    Pages 9-15

  • Statistical Nano CMOS Variability and Its Impact on SRAM

    Asenov, Asen

    Pages 17-49

  • Importance Sampling-Based Estimation: Applications to Memory Design

    Kanj, Rouwaida (et al.)

    Pages 51-96

  • Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics

    Wong, Robert C.

    Pages 97-136

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-1-4419-6606-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-1-4419-6605-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • ISBN 978-1-4614-2672-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Extreme Statistics in Nanoscale Memory Design
Editors
  • Amith Singhee
  • Rob A. Rutenbar
Series Title
Integrated Circuits and Systems
Copyright
2010
Publisher
Springer US
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-6606-3
DOI
10.1007/978-1-4419-6606-3
Hardcover ISBN
978-1-4419-6605-6
Softcover ISBN
978-1-4614-2672-1
Series ISSN
1558-9412
Edition Number
1
Number of Pages
X, 246
Topics