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Scanning Probe Microscopy of Functional Materials

Nanoscale Imaging and Spectroscopy

Editors: Kalinin, Sergei V., Gruverman, Alexei (Eds.)

  • Serves the rapidly developing field of nanoscale characterization of functional materials properties. Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors. Focuses on newly emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations. Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

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eBook $229.00
price for USA (gross)
  • ISBN 978-1-4419-7167-8
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  • Immediate eBook download after purchase
Hardcover $289.00
price for USA
  • ISBN 978-1-4419-6567-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

About the authors

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Table of contents (18 chapters)

  • Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy

    Maksymovych, Peter

    Pages 3-37

  • High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy

    Malkin, Alexander J. (et al.)

    Pages 39-68

  • Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

    Hölscher, Hendrik (et al.)

    Pages 71-94

  • Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods

    Hurley, D. C.

    Pages 95-124

  • Multi-Frequency Atomic Force Microscopy

    Proksch, Roger

    Pages 125-151

Buy this book

eBook $229.00
price for USA (gross)
  • ISBN 978-1-4419-7167-8
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $289.00
price for USA
  • ISBN 978-1-4419-6567-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Probe Microscopy of Functional Materials
Book Subtitle
Nanoscale Imaging and Spectroscopy
Editors
  • Sergei V. Kalinin
  • Alexei Gruverman
Copyright
2011
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-7167-8
DOI
10.1007/978-1-4419-7167-8
Hardcover ISBN
978-1-4419-6567-7
Edition Number
1
Number of Pages
XVIII, 555
Topics