Sample Preparation Handbook for Transmission Electron Microscopy

Authors: Ayache, J., Beaunier, L., Boumendil, J., Ehret, G., Laub, D.

  • First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials
  • Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)
  • Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
  • Complementary interactive database website is available to scientists worldwide
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Buy this book

Special Cover Type $199.00
price for USA
  • ISBN 978-1-4419-6087-0
  • Free shipping for individuals worldwide
  • Online orders shipping within 2-3 days.
About this book

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope.

The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.

The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab.

Key Features of the Handbook:

  • Combines all of the latest techniques for the preparation of mineral to biological samples
  • Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)
  • Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
  • Links to a complementary interactive database website which is available to scientists worldwide*
  • Written by authors with 100 years of combined experience in electron microscopy

*http://temsamprep.in2p3.fr/

Buy this book

Special Cover Type $199.00
price for USA
  • ISBN 978-1-4419-6087-0
  • Free shipping for individuals worldwide
  • Online orders shipping within 2-3 days.

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Bibliographic Information

Bibliographic Information
Book Title
Sample Preparation Handbook for Transmission Electron Microscopy
Authors
Copyright
2010
Publisher
Springer-Verlag New York
Copyright Holder
Springer-Verlag New York
Special Cover Type ISBN
978-1-4419-6087-0
Edition Number
1
Number of Pages
670
Topics