Power-Aware Testing and Test Strategies for Low Power Devices

Editors: Girard, Patrick, Nicolici, Nicola, Wen, Xiaoqing (Eds.)

  • Is the only comprehensive book on power-aware test for (low power) circuits and systems
  • Instructs readers how low-power devices can be tested safely without affecting yield and reliability
  • Includes necessary background information on design for test and low-power design
  • Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems
  • Presents state-of-the-art industrial practices and EDA solutions
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eBook $149.00
price for USA (gross)
  • ISBN 978-1-4419-0928-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-1-4419-0927-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.00
price for USA
  • ISBN 978-1-4899-8313-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Power-Aware Testing and Test Strategies for Low-Power Devices

Edited by:

Patrick Girard, Research Director, CNRS / LIRMM, France

Nicola Nicolici, Associate Professor, McMaster University, Canada

Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan

Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices.

  1. The first comprehensive book on power-aware test for (low-power) circuits and systems
  2. Shows readers how low-power devices can be tested safely without affecting yield and reliability
  3. Includes necessary background information on design-for-test and low-power design
  4. Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression
  5. Presents state-of-the-art industrial practices and EDA solutions

Table of contents (11 chapters)

  • Fundamentals of VLSI Testing

    Wang, Laung-Terng (et al.)

    Pages 1-29

  • Power Issues During Test

    Kundu, Sandip (et al.)

    Pages 31-63

  • Low-Power Test Pattern Generation

    Wen, Xiaoqing (et al.)

    Pages 65-115

  • Power-Aware Design-for-Test

    Wunderlich, Hans-Joachim (et al.)

    Pages 117-146

  • Power-Aware Test Data Compression and BIST

    Goel, Sandeep Kumar (et al.)

    Pages 147-173

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-1-4419-0928-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-1-4419-0927-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.00
price for USA
  • ISBN 978-1-4899-8313-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Power-Aware Testing and Test Strategies for Low Power Devices
Editors
  • Patrick Girard
  • Nicola Nicolici
  • Xiaoqing Wen
Copyright
2010
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-1-4419-0928-2
DOI
10.1007/978-1-4419-0928-2
Hardcover ISBN
978-1-4419-0927-5
Softcover ISBN
978-1-4899-8313-8
Edition Number
1
Number of Pages
XXI, 363
Topics