Frontiers in Electronic Testing

New Methods of Concurrent Checking

Authors: Gössel, M., Ocheretny, V., Sogomonyan, E., Marienfeld, D.

  • Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults
  • Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed
  • The only book which describes the most important methods of concurrent checking developed in the last 15 years
  • The only book which contains a detailed description of the best possible error detection circuits for all types of adders
  • Shows for the first time how soft-error correction can be combined with concurrent checking
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Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-1-4020-8420-1
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $189.00
price for USA
  • ISBN 978-1-4020-8419-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $189.00
price for USA
  • ISBN 978-90-481-7876-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

New Methods of Concurrent Checking is the ultimate reference to answer the question as to how the best possible state-of-the-art error detection circuits can be designed. The most effective methods of concurrent checking for digital circuits are comprehensively described which were developed in the last 15 years. Some of the methods are published for the first time. How concurrent checking can be combined with soft error correction is also shown for the first time. This book is invaluable in considering the design of reliable systems in the emerging Nanotechnologies with an associated growing number of transient faults.

Written by a team of two leading experts and two very successful young former PhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others. A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures.

New Methods of Concurrent Checking is approved in many university courses for graduate and undergraduate students, and it is of interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in the design and the understanding of reliable circuits and computers.

Table of contents (4 chapters)

  • Introduction

    Göessel, Michael (et al.)

    Pages 1-4

  • Physical Faults and Functional Errors

    Göessel, Michael (et al.)

    Pages 5-29

  • Principles of Concurrent Checking

    Göessel, Michael (et al.)

    Pages 31-121

  • Concurrent Checking for the Adders

    Göessel, Michael (et al.)

    Pages 123-171

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-1-4020-8420-1
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $189.00
price for USA
  • ISBN 978-1-4020-8419-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $189.00
price for USA
  • ISBN 978-90-481-7876-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
New Methods of Concurrent Checking
Authors
Series Title
Frontiers in Electronic Testing
Series Volume
42
Copyright
2008
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media B.V.
eBook ISBN
978-1-4020-8420-1
DOI
10.1007/978-1-4020-8420-1
Hardcover ISBN
978-1-4020-8419-5
Softcover ISBN
978-90-481-7876-6
Series ISSN
0929-1296
Edition Number
1
Number of Pages
VIII, 182
Topics