Frontiers in Electronic Testing

Introduction to Advanced System-on-Chip Test Design and Optimization

Authors: Larsson, Erik

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eBook $189.00
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  • ISBN 978-0-387-25624-5
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Hardcover $249.00
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  • ISBN 978-1-4020-3207-3
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Softcover $249.00
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  • ISBN 978-1-4419-5269-1
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About this book

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

About the authors

Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies

Table of contents (3 chapters)

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-0-387-25624-5
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.00
price for USA
  • ISBN 978-1-4020-3207-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $249.00
price for USA
  • ISBN 978-1-4419-5269-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Introduction to Advanced System-on-Chip Test Design and Optimization
Authors
Series Title
Frontiers in Electronic Testing
Series Volume
29
Copyright
2005
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-25624-5
DOI
10.1007/b135763
Hardcover ISBN
978-1-4020-3207-3
Softcover ISBN
978-1-4419-5269-1
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XX, 388
Topics