Nato Science Series: IV:

Risk Methodologies for Technological Legacies

Editors: Bley, Dennis, Eremenko, Vitaly A. (Eds.)

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About this book

The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potential accidents. Facility contamination and environmental degradation, as well as the accident­ vulnerable facilities and equipment, are a result of weapons development, testing, and production. Although the countries face similar issues from similar activities, important differences in waste management practices make the potential environmental and health risks of more immediate concern in the FSU and Eastern Europe. In the West, most nuclear and chemical waste is stored in known contained locations, while in the East, much of the equivalent material is unconfined, contaminating the environment. In the past decade, the U.S. started to address and remediate these Cold War legacies. Costs have been very high, and the projected cost estimates for total cleanup are still increasing. Currently in Russia, the resources for starting such major activities continue to be unavailable.

Table of contents (18 chapters)

  • Introduction

    Bley, Dennis C. (et al.)

    Pages 1-3

  • Complementary Risk Management: A Unified View for Decision Makers

    Bley, Dennis C. (et al.)

    Pages 7-28

  • Radiation Legacy of the Soviet Nuclear Complex

    Bley, Dennis C. (et al.)

    Pages 31-57

  • Status and Challenges of Managing Risks in the U.S. Department of Energy Environmental Management Program

    Bley, Dennis C. (et al.)

    Pages 59-74

  • Perception of Risk, Health, and Inequality

    Bley, Dennis C. (et al.)

    Pages 75-85

Buy this book

eBook $89.00
price for USA (gross)
  • ISBN 978-94-010-0097-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $269.00
price for USA
  • ISBN 978-1-4020-1257-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $119.00
price for USA
  • ISBN 978-1-4020-1258-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Risk Methodologies for Technological Legacies
Editors
  • Dennis Bley
  • Vitaly A. Eremenko
Series Title
Nato Science Series: IV:
Series Volume
18
Copyright
2003
Publisher
Springer Netherlands
Copyright Holder
Springer Science+Business Media Dordrecht
eBook ISBN
978-94-010-0097-0
DOI
10.1007/978-94-010-0097-0
Hardcover ISBN
978-1-4020-1257-0
Softcover ISBN
978-1-4020-1258-7
Series ISSN
1568-1238
Edition Number
1
Number of Pages
XXVII, 366
Topics