Editors:
- Self-contained volume examining new results in applied probability and statistics
- Contains a broad range of survey articles written by experts currently working on the development and evaluation of new models and methods in the field
- While many books deal with general theory, several chapters in this volume explore more specific connections and recent results in "real-world" reliability theory having applications to such areas as biostatistics, cancer prognosis, air pollution analysis, and aging
Part of the book series: Statistics for Industry and Technology (SIT)
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Table of contents (33 chapters)
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Front Matter
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Accelerated Failure Time Models and Analyses
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Front Matter
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Aging Properties and Analyses
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Front Matter
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Analyses of Censored and Truncated Data
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Front Matter
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About this book
Parametric and semiparametric models are tools with a wide range of applications to reliability, survival analysis, and quality of life. This self-contained volume examines these tools in survey articles written by experts currently working on the development and evaluation of models and methods. While a number of chapters deal with general theory, several explore more specific connections and recent results in "real-world" reliability theory, survival analysis, and related fields.
Editors and Affiliations
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Department of Mathematics and Statistics, McMaster University, Hamilton, Canada
N. Balakrishnan
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Laboratoire Statistique Mathématique, Université Bordeaux 2, Bordeaux Cedex, France
M. S. Nikulin
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Laboratory of Statistical Methods, V. Steklov Mathematical Institute, St. Petersburg, Russia
M. S. Nikulin
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UFR SSI, Université de Bretagne-Sud, Vannes Cedex, France
M. Mesbah
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Division Mathématiques Appliquées, Université de Technologie de Compiègne, Compiègne Cedex, France
N. Limnios
Bibliographic Information
Book Title: Parametric and Semiparametric Models with Applications to Reliability, Survival Analysis, and Quality of Life
Editors: N. Balakrishnan, M. S. Nikulin, M. Mesbah, N. Limnios
Series Title: Statistics for Industry and Technology
DOI: https://doi.org/10.1007/978-0-8176-8206-4
Publisher: Birkhäuser Boston, MA
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2004
Hardcover ISBN: 978-0-8176-3231-1Published: 24 June 2004
Softcover ISBN: 978-1-4612-6491-0Published: 23 October 2012
eBook ISBN: 978-0-8176-8206-4Published: 11 November 2013
Series ISSN: 2364-6241
Series E-ISSN: 2364-625X
Edition Number: 1
Number of Pages: XLI, 555
Topics: Statistical Theory and Methods, Applications of Mathematics, Probability Theory and Stochastic Processes, Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences