Statistics for Industry and Technology

Scan Statistics

Methods and Applications

Editors: Glaz, Joseph, Pozdnyakov, Vladimir, Wallenstein, Sylvan (Eds.)

  • Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed
  • Many current results and new directions for future research are featured
  • Contains extensive references to research articles, books, and relevant computer software
  • May be used as a textbook for a graduate-level seminar on scan statistics
see more benefits

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-0-8176-4749-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-0-8176-4748-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.

Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

Key features:


* Chapters are written by leading experts in the field.

* Features many current results and highlights new directions for future research.

* Includes challenging theoretical methodological research problems.

* Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed.

* Real-world applications to areas such as bioinformatics and biosurveillance are emphasized.

* Contains extensive references to research articles, books, and relevant computer software.

 

Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

Reviews

From the reviews:

“The area of scan statistics has developed rapidly in recent years. … provided excellent overviews of the area. … There are many papers of interest here for the readers of Technometrics. … This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified.” (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)

Table of contents (17 chapters)

  • Joseph Naus: Father of the Scan Statistic

    Wallenstein, Sylvan

    Pages 1-25

  • Precedence-Type Tests for the Comparison of Treatments with a Control

    Balakrishnan, Narayanaswamy (et al.)

    Pages 27-54

  • Extreme Value Results for Scan Statistics

    Boutsikas, Michael V. (et al.)

    Pages 55-85

  • Boundary Crossing Probability Computationsin the Analysis of Scan Statistics

    Chan, Hock Peng (et al.)

    Pages 87-108

  • Approximations for Two-Dimensional Variable Window Scan Statistics

    Chen, Jie (et al.)

    Pages 109-128

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-0-8176-4749-0
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-0-8176-4748-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Scan Statistics
Book Subtitle
Methods and Applications
Editors
  • Joseph Glaz
  • Vladimir Pozdnyakov
  • Sylvan Wallenstein
Series Title
Statistics for Industry and Technology
Copyright
2009
Publisher
Birkhäuser Basel
Copyright Holder
Birkhäuser Boston
eBook ISBN
978-0-8176-4749-0
DOI
10.1007/978-0-8176-4749-0
Hardcover ISBN
978-0-8176-4748-3
Series ISSN
2364-6241
Edition Number
1
Number of Pages
XXVIII, 394
Number of Illustrations and Tables
40 b/w illustrations
Topics