Springer celebrates 175 years of publishing excellence! Join us >>

Modeling and Simulation in Science, Engineering and Technology

Data Modeling for Metrology and Testing in Measurement Science

Editors: Pavese, Franco, Forbes, Alistair B. (Eds.)

  • Takes the reader beyond mainstream methods described in standard texts on data and uncertainty analysis
  • Real-world applications in a variety of fields, including chemistry, software engineering, and metrology
  • For a broad audience of graduate students, researchers, and practitioners in metrology, mathematics, statistics, chemistry, and software engineering
  • May be used as a textbook in graduate courses on modeling and computational methods, or as a training manual in the fields of calibration and testing
see more benefits

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-0-8176-4804-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-0-8176-4592-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This book and companion DVD provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods described in standard texts. The emphasis throughout is on techniques having a broad range of real-world applications in measurement science.
Mainstream methods of data modeling and analysis typically rely on certain assumptions that do not hold for many practical applications. Developed in this work are methods and computational tools to address general models that arise in practice, allowing for a more valid treatment of calibration and test data and providing a deeper understanding of complex situations in measurement science.
Additional features and topics of the book include:
* Introduction to modeling principles in metrology and testing
* Presentation of a basic probability framework in metrology and statistical approaches to uncertainty assessment
* Discussion of the latest developments in data analysis using least squares, Fast Fourier Transform, wavelets, and fuzzy logic methods
* Data fusion using neural networks, fuzzy methods, decision making, and risk analysis
* A computer-assisted, rigorous approach to data evaluation and analysis of measurement software validity
* Introduction to virtual instruments, and an overview of IT tools for measurement science
Data Modeling for Metrology and Testing in Measurement Science may be used as a textbook in graduate courses on data modeling and computational methods, or as a training manual in the fields of calibration and testing. The book will also serve as an excellent reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.

Reviews

From the reviews:

“This is a surprisingly eclectic compilation that I found full of interesting concepts and new knowledge. … Academic researchers and National Measurement Institutes will certainly recommend the text to their libraries. Their research students will benefit … .”­­­ (D. Brynn Hibbert, Accreditation and Quality Assurance, Vol. 15, 2010)

Table of contents (14 chapters)

  • Software Validation and Preventive Software Quality Assurance for Metrology

    Greif, Norbert (et al.)

    Pages 1-41

  • Comparing Results of Chemical Measurements: Some Basic Questions from Practice

    Bièvre, Paul

    Pages 1-19

  • Internet-Enabled Metrology

    Tasić, Tanasko

    Pages 1-19

  • Data Fusion, Decision-Making, and Risk Analysis: Mathematical Tools and Techniques

    Girão, Pedro S. (et al.)

    Pages 1-50

  • Monte Carlo Modeling of Randomness

    Steele, Alan G. (et al.)

    Pages 1-41

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-0-8176-4804-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-0-8176-4592-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Data Modeling for Metrology and Testing in Measurement Science
Editors
  • Franco Pavese
  • Alistair B. Forbes
Series Title
Modeling and Simulation in Science, Engineering and Technology
Copyright
2009
Publisher
Birkhäuser Basel
Copyright Holder
Birkhäuser Boston
eBook ISBN
978-0-8176-4804-6
DOI
10.1007/978-0-8176-4804-6
Hardcover ISBN
978-0-8176-4592-2
Series ISSN
2164-3679
Edition Number
1
Number of Pages
XVIII, 486
Number of Illustrations and Tables
111 b/w illustrations
Topics