The Springer International Series in Engineering and Computer Science

Simultaneous Switching Noise of CMOS Devices and Systems

Authors: Senthinathan, Ramesh, Prince, John L.

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About this book

This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086).

Table of contents (11 chapters)

  • Introduction

    Senthinathan, Ramesh (et al.)

    Pages 1-7

  • Packaged/Scaled Cmos Devices

    Senthinathan, Ramesh (et al.)

    Pages 9-18

  • Methods of Calculating Simultaneous Switching Noise

    Senthinathan, Ramesh (et al.)

    Pages 19-32

  • Power Distribution Inductance Modeling

    Senthinathan, Ramesh (et al.)

    Pages 33-51

  • Signal Conductors Over a Perforated Reference Plane

    Senthinathan, Ramesh (et al.)

    Pages 53-84

Buy this book

eBook $149.00
price for USA (gross)
  • ISBN 978-1-4615-3204-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.00
price for USA
  • ISBN 978-0-7923-9400-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $199.00
price for USA
  • ISBN 978-1-4613-6406-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Simultaneous Switching Noise of CMOS Devices and Systems
Authors
Series Title
The Springer International Series in Engineering and Computer Science
Series Volume
249
Copyright
1994
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4615-3204-0
DOI
10.1007/978-1-4615-3204-0
Hardcover ISBN
978-0-7923-9400-6
Softcover ISBN
978-1-4613-6406-1
Series ISSN
0893-3405
Edition Number
1
Number of Pages
XXI, 205
Topics