The Springer International Series in Engineering and Computer Science

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Authors: Pineda de Gyvez, Jose

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eBook $139.00
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  • ISBN 978-1-4615-3158-6
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Hardcover $179.00
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  • ISBN 978-0-7923-9306-1
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Softcover $179.00
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About this book

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

Table of contents (8 chapters)

  • Introduction

    Gyvez, José Pineda

    Pages 1-6

  • Defect Semantics and Yield Modeling

    Gyvez, José Pineda

    Pages 7-27

  • Computational Models for Defect-Sensitivity

    Gyvez, José Pineda

    Pages 29-47

  • Single Defect Multiple Layer (SDML) Model

    Gyvez, José Pineda

    Pages 49-78

  • Fault Analysis and Multiple Layer Critical Areas

    Gyvez, José Pineda

    Pages 79-91

Buy this book

eBook $139.00
price for USA (gross)
  • ISBN 978-1-4615-3158-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.00
price for USA
  • ISBN 978-0-7923-9306-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.00
price for USA
  • ISBN 978-1-4613-6383-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Authors
Series Title
The Springer International Series in Engineering and Computer Science
Series Volume
208
Copyright
1993
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4615-3158-6
DOI
10.1007/978-1-4615-3158-6
Hardcover ISBN
978-0-7923-9306-1
Softcover ISBN
978-1-4613-6383-5
Series ISSN
0893-3405
Edition Number
1
Number of Pages
XXIV, 167
Number of Illustrations and Tables
48 b/w illustrations
Topics