Advances in Database Systems

Mutation Testing for the New Century

Editors: Wong, W. Eric (Ed.)

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eBook $179.00
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  • ISBN 978-1-4757-5939-6
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About this book

Extensive research and development has produce mutation tools for languages such as Fortran, Ada, C, and IDL; empirical evaluations comparing mutation with other test adequacy criteria; empirical evidence and theoretical justification for the coupling effect; and techniques for speeding up mutation testing using various types of high performance architectures. Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation.
Mutation Testing for the New Century brings together cutting edge research results in mutation testing from a wide range of researchers. This book provides answers to key questions related to mutation and raises questions yet to be answered. It is an excellent resource for researchers, practitioners, and students of software engineering.

Table of contents (19 chapters)

  • Keynote Why Software Falls Down

    DeMillo, Rich

    Pages 1-1

  • Keynote Mutation: The Early Days

    Lipton, Dick

    Pages 2-2

  • Investigating the Effectiveness of Object-Oriented Strategies with the Mutation Method

    Kim, Sunwoo (et al.)

    Pages 4-4

  • The Relationship Between Program Dependence and Mutation Analysis

    Harman, Mark (et al.)

    Pages 5-13

  • Mutation of Model Checker Specifications for Test Generation and Evaluation

    Black, Paul E. (et al.)

    Pages 14-20

Buy this book

eBook $179.00
price for USA (gross)
  • ISBN 978-1-4757-5939-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $229.00
price for USA
  • ISBN 978-0-7923-7323-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $229.00
price for USA
  • ISBN 978-1-4419-4888-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Mutation Testing for the New Century
Editors
  • W. Eric Wong
Series Title
Advances in Database Systems
Series Volume
24
Copyright
2001
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-5939-6
DOI
10.1007/978-1-4757-5939-6
Hardcover ISBN
978-0-7923-7323-0
Softcover ISBN
978-1-4419-4888-5
Series ISSN
1386-2944
Edition Number
1
Number of Pages
XI, 118
Number of Illustrations and Tables
25 b/w illustrations
Topics