Sample Preparation Handbook for Transmission Electron Microscopy

Methodology

Authors: Ayache, J., Beaunier, L., Boumendil, J., Ehret, G., Laub, D.

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eBook $109.00
price for USA (gross)
  • ISBN 978-0-387-98182-6
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  • Included format: PDF, EPUB
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  • Immediate eBook download after purchase
Hardcover $149.00
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  • ISBN 978-0-387-98181-9
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  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
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  • ISBN 978-1-4899-8697-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.

Key Features of the Handbook:

  • Combines all of the latest techniques for the preparation of mineral to biological samples
  • Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)
  • Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
  • Links to a complementary interactive database website which is available to scientists worldwide*
  • Written by authors with 100 years of combined experience in electron microscopy
http://temsamprep.in2p3.fr/

Table of contents (9 chapters)

  • Methodology: General Introduction

    Ayache, Jeanne (et al.)

    Pages 1-2

  • Introduction to Materials

    Ayache, Jeanne (et al.)

    Pages 3-31

  • The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)

    Ayache, Jeanne (et al.)

    Pages 33-55

  • Materials Problems and Approaches for TEM and TEM/STEM Analyses

    Ayache, Jeanne (et al.)

    Pages 57-81

  • Physical and Chemical Mechanisms of Preparation Techniques

    Ayache, Jeanne (et al.)

    Pages 83-123

Buy this book

eBook $109.00
price for USA (gross)
  • ISBN 978-0-387-98182-6
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $149.00
price for USA
  • ISBN 978-0-387-98181-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-8697-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Sample Preparation Handbook for Transmission Electron Microscopy
Book Subtitle
Methodology
Authors
Copyright
2010
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-0-387-98182-6
DOI
10.1007/978-0-387-98182-6
Hardcover ISBN
978-0-387-98181-9
Softcover ISBN
978-1-4899-8697-9
Edition Number
1
Number of Pages
XXIII, 250
Topics