Electron Backscatter Diffraction in Materials Science

Editors: Schwartz, A.J., Kumar, M., Adams, B.L., Field, D.P. (Eds.)

  • Brings together a collection of approximately 25 chapters written by experts in the field
  • Provides everything a researcher needs to enter and succeed in the field of electron backscatter diffraction
  • Includes a broad range of illustrative examples of the applications of electron backscatter diffraction to both materials science and condensed matter physics
  • Revised to reflect changes in the field in the past seven years, including an entirely new section on fundamentals and new material on current examples of applications
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eBook $89.00
$129.00 (listprice)
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valid through February 28, 2018
  • ISBN 978-0-387-88136-2
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  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $119.00
$199.99 (listprice)
price for USA
valid through February 28, 2018
  • ISBN 978-0-387-88135-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $119.00
$169.99 (listprice)
price for USA
valid through February 28, 2018
  • ISBN 978-1-4899-9334-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials.  The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale.

This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures.  Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.

About the authors

Adam J. Schwartz is the Deputy Division Leader for Condensed Matter and High Pressure Physics in the Physics and Advanced Technologies Directorate. Dr. Schwartz joined LLNL as a post-doctoral research associate to investigate the systematics of displacive phase transformations after receiving his PhD from the University of Pittsburgh in 1991. His areas of interests focus on structure-propoerty-processing relations, aging and phase transformations in actinides; influence of microstructure and impurities on high-strain rate deformation behavior, texture and texture gradients in materials, intercrystalline defects and the role of grain boundary character distribution in materials, conventional and high resolution transmission electron microscopy, and electron backscatter diffraction. Dr. Schwartz has authored over 50 publications and has one patent.

Mukul Kumar joined as a staff scientist in the Materials Science and Technology Division in 1998 after completing a stint as a post-doctoral fellow at Johns Hopkins University. Prior to that, he received his PhD from the University of Cincinnati, where he was an Oak Ridge Institute for Science and Engineering Fellow and also received the ASM International Arthur Focke Award for his dissertation work. His areas of interest include the relationship between properties and microstructures, particularly as related to extreme environments encountered in turbine jet engine and nuclear reactor environments and high strain rate and pressure conditions; defect analysis using conventional transmission electron microscopy; and electron backscatter diffraction. Kumar has authored over 70 publications and has two patents.

Table of contents (27 chapters)

  • Present State of Electron Backscatter Diffraction and Prospective Developments

    Schwarzer, Robert A. (et al.)

    Pages 1-20

  • Dynamical Simulation of Electron Backscatter Diffraction Patterns

    Winkelmann, Aimo

    Pages 21-33

  • Representations of Texture

    Mason, Jeremy K. (et al.)

    Pages 35-51

  • Energy Filtering in EBSD

    Eades, Alwyn (et al.)

    Pages 53-63

  • Spherical Kikuchi Maps and Other Rarities

    Day, Austin P.

    Pages 65-80

Buy this book

eBook $89.00
$129.00 (listprice)
price for USA (gross)
valid through February 28, 2018
  • ISBN 978-0-387-88136-2
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $119.00
$199.99 (listprice)
price for USA
valid through February 28, 2018
  • ISBN 978-0-387-88135-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $119.00
$169.99 (listprice)
price for USA
valid through February 28, 2018
  • ISBN 978-1-4899-9334-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Electron Backscatter Diffraction in Materials Science
Editors
  • Adam J. Schwartz
  • Mukul Kumar
  • Brent L. Adams
  • David P. Field
Copyright
2009
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-88136-2
DOI
10.1007/978-0-387-88136-2
Hardcover ISBN
978-0-387-88135-5
Softcover ISBN
978-1-4899-9334-2
Edition Number
2
Number of Pages
XXII, 403
Topics