Editors:
- Covers various technologies that have been suggested by researchers over the last decades
- Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubes
- Discusses different aspects of test and defect tolerance for crossbar-based nanoscale devices
- Contains five chapters focusing on test, defect tolerance and reliability for QCA circuits
- Presents methods for testing and diagnosis of realistic defects in digital microfluidic biochips
- Includes three chapters dealing with the reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits
- Includes supplementary material: sn.pub/extras
Part of the book series: Frontiers in Electronic Testing (FRET, volume 37)
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Table of contents (14 chapters)
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Front Matter
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Test and Defect Tolerance for Crossbar-Based Architectures
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Front Matter
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Test and Defect Tolerance for QCA Circuits
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Front Matter
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Testing Microfluidic Biochips
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Front Matter
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Reliability for Nanotechnology Devices
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Front Matter
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Back Matter
About this book
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Editors and Affiliations
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Department of Electrical and Computer Engineering, University of Connecticut, Storrs, USA
Mohammad Tehranipoor
Bibliographic Information
Book Title: Emerging Nanotechnologies
Book Subtitle: Test, Defect Tolerance, and Reliability
Editors: Mohammad Tehranipoor
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-0-387-74747-7
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2008
Hardcover ISBN: 978-0-387-74746-0Published: 10 December 2007
Softcover ISBN: 978-1-4419-4513-6Published: 23 November 2010
eBook ISBN: 978-0-387-74747-7Published: 08 December 2007
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XII, 408
Number of Illustrations: 200 b/w illustrations
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Nanotechnology, Quality Control, Reliability, Safety and Risk, Electrical Engineering