Frontiers in Electronic Testing

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

  • Discusses test and defect tolerance for crossbar-based nanoscale devices
  • Five chapters focus on test, defect tolerance and reliability for QCA circuits
  • Offers methods for testing and diagnosis of realistic defects in digital microfluidic biochips
  • Includes three chapters on reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits
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eBook $189.00
price for USA (gross)
  • ISBN 978-0-387-74747-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.00
price for USA
  • ISBN 978-0-387-74746-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $249.00
price for USA
  • ISBN 978-1-4419-4513-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Table of contents (14 chapters)

  • Defect-Tolerant Logic with Nanoscale Crossbar Circuits

    Hogg, T. (et al.)

    Pages 5-32

  • Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics

    Wang, Z. (et al.)

    Pages 33-61

  • Test and Defect Tolerance for Reconfigurable Nanoscale Devices

    Tehranipoor, M. (et al.)

    Pages 63-93

  • A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology

    Brown, J. G. (et al.)

    Pages 95-120

  • Defect Tolerance in Crossbar Array Nano-Architectures

    Tahoori, M. B.

    Pages 121-151

Buy this book

eBook $189.00
price for USA (gross)
  • ISBN 978-0-387-74747-7
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $249.00
price for USA
  • ISBN 978-0-387-74746-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $249.00
price for USA
  • ISBN 978-1-4419-4513-6
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Emerging Nanotechnologies
Book Subtitle
Test, Defect Tolerance, and Reliability
Series Title
Frontiers in Electronic Testing
Series Volume
37
Copyright
2008
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-74747-7
DOI
10.1007/978-0-387-74747-7
Hardcover ISBN
978-0-387-74746-0
Softcover ISBN
978-1-4419-4513-6
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XII, 408
Number of Illustrations and Tables
200 b/w illustrations
Topics