Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

Authors: Kalinin, Sergei V., Gruverman, Alexei

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eBook $419.00
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  • ISBN 978-0-387-28668-6
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Hardcover $529.00
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  • ISBN 978-0-387-28667-9
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Softcover $529.00
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  • ISBN 978-1-4939-5036-2
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  • Usually dispatched within 3 to 5 business days.
About this book

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Reviews

From the reviews:

"The stated goal of this book is ‘to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.’ … The images are particularly clear even to the non-specialist eyes. … The black and white and color figures are of good quality. The photographs are all excellent. … will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)


Table of contents (10 chapters)

  • Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy

    Dr. P. Eyben, Prof. W. Vandervorst, D. Alvarez, Dr. M. Xu, Dr. M. Fouchier

    Pages 31-87

  • Principles of Kelvin Probe Force Microscopy

    Dr. Th. Glatzel, Prof. Dr. M.Ch. Lux-Steiner, E. Strassburg, et al.

    Pages 113-131

  • Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

    Dr. A. L. Kholkin, Dr. S. V. Kalinin, Dr. A. Roelofs, et al.

    Pages 173-214

  • Principles of Near-Field Microwave Microscopy

    Prof. Steven M. Anlage, Dr. Vladimir V. Talanov, Dr. Andrew R. Schwartz

    Pages 215-253

  • Electrochemical SPM

    T. J. Smith, Prof. K. J. Stevenson

    Pages 280-314

Buy this book

eBook $419.00
price for USA (gross)
  • ISBN 978-0-387-28668-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $529.00
price for USA
  • ISBN 978-0-387-28667-9
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $529.00
price for USA
  • ISBN 978-1-4939-5036-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Probe Microscopy
Book Subtitle
Electrical and Electromechanical Phenomena at the Nanoscale
Authors
Copyright
2007
Publisher
Springer-Verlag New York
Copyright Holder
Springer-Verlag New York
eBook ISBN
978-0-387-28668-6
DOI
10.1007/978-0-387-28668-6
Hardcover ISBN
978-0-387-28667-9
Softcover ISBN
978-1-4939-5036-2
Edition Number
1
Number of Pages
XXXVIII, 980
Number of Illustrations and Tables
13 b/w illustrations, 16 illustrations in colour
Topics