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New & Forthcoming Titles | Frontiers in Electronic Testing

Frontiers in Electronic Testing

Frontiers in Electronic Testing

Agrawal, Vishwani (Ed.)

ISSN: 0929-1296

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  • Defect Oriented Testing for CMOS Analog and Digital Circuits
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    Defect Oriented Testing for CMOS Analog and Digital Circuits

    Series: Frontiers in Electronic Testing, Vol. 10

    Sachdev, Manoj 1999, or go to the Latest Edition

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    ISBN 978-1-4757-4926-7
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  • Testing Static Random Access Memories
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    Testing Static Random Access Memories

    Defects, Fault Models and Test Patterns

    Series: Frontiers in Electronic Testing, Vol. 26

    Hamdioui, Said 2004

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    ISBN 978-1-4757-6706-3
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    ISBN 978-1-4020-7752-4
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    ISBN 978-1-4419-5430-5
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  • Design for AT-Speed Test, Diagnosis and Measurement
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    Design for AT-Speed Test, Diagnosis and Measurement

    Series: Frontiers in Electronic Testing, Vol. 15

    Nadeau-Dostie, Benoit (Ed.) 2000

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    ISBN 978-0-306-47544-3
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    ISBN 978-0-7923-8669-8
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    ISBN 978-1-4757-8291-2
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  • High Performance Memory Testing
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    High Performance Memory Testing

    Design Principles, Fault Modeling and Self-Test

    Series: Frontiers in Electronic Testing, Vol. 22A

    Adams, R. Dean 2003

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    ISBN 978-0-306-47972-4
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    ISBN 978-1-4020-7255-0
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    ISBN 978-1-4757-8474-9
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  • SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
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    SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

    Series: Frontiers in Electronic Testing, Vol. 21

    Chakrabarty, Krishnendu 2002

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    ISBN 978-1-4757-6527-4
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    ISBN 978-1-4020-7205-5
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    ISBN 978-1-4419-5307-0
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  • Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
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      $104.00
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    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Series: Frontiers in Electronic Testing, Vol. 17

    Bushnell, M., Agrawal, Vishwani 2002

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    ISBN 978-0-306-47040-0
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    ISBN 978-0-7923-7991-1
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    ISBN 978-1-4757-8142-7
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  • A Designer’s Guide to Built-In Self-Test
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    A Designer’s Guide to Built-In Self-Test

    Series: Frontiers in Electronic Testing, Vol. 19

    Stroud, Charles E. 2002

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    ISBN 978-0-306-47504-7
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    ISBN 978-1-4020-7050-1
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    ISBN 978-1-4757-7626-3
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  • Embedded Processor-Based Self-Test
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    Embedded Processor-Based Self-Test

    Series: Frontiers in Electronic Testing, Vol. 28

    Gizopoulos, Dimitris, Paschalis, A., Zorian, Yervant 2004

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    ISBN 978-1-4020-2801-4
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    ISBN 978-1-4020-2785-7
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    ISBN 978-1-4419-5252-3
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  • On-Line Testing for VLSI
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    On-Line Testing for VLSI

    Series: Frontiers in Electronic Testing, Vol. 11

    Nicolaidis, Michael, Zorian, Yervant, Pradhan, Dhiraj (Eds.) 1998

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    ISBN 978-1-4757-6069-9
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    ISBN 978-0-7923-8132-7
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    ISBN 978-1-4419-5033-8
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  • Reasoning in Boolean Networks
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    Reasoning in Boolean Networks

    Logic Synthesis and Verification Using Testing Techniques

    Series: Frontiers in Electronic Testing, Vol. 9

    Kunz, Wolfgang, Stoffel, Dominik 1997

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    ISBN 978-1-4757-2572-8
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    ISBN 978-0-7923-9921-6
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    ISBN 978-1-4419-5176-2
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