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New & Forthcoming Titles | Statistics for Industry and Technology

Statistics for Industry and Technology

Statistics for Industry and Technology

Series Ed.: Balakrishnan, N.

A product of Birkhäuser Boston

Aims and Scope

Statistics plays a critical role in any modern use of technology in science and industry. Statistical concepts and methods are developed and applied in industries for various problems – for example, in order to monitor the quality of products, to plan effective and efficient designs to improve standards, to test and analyze the quality of items produced, and to accept (reject) conforming (nonconforming) units produced. The increased attention paid to these problems, and accompanying new statistical methodologies, has created an active and valuable new area of research and application-industrial statistics. The principal aim of the series is to sponsor publications addressing one or more of these critical information needs.

Publications in the series will contain statistical information that is accessible to an interdisciplinary audience: carefully organized authoritative presentations, numerous illustrative examples based on current practice, reliable methods, realistic data sets, and discussions of select new emerging methods and their application potential.

Principal Topic Areas

Life Testing * Reliability * Quality Monitoring * Quality Management * Quality Control * Time Series with Applications * Decision Theory * Survival Analysis * Prediction and Tolerance Analysis * Multivariate Statistical Methods * Nondestructive Testing * Accelerated Testing * Signal Processing * Design of Experiments * Computer Methods for Quality * Manufacturing * Software Reliability * Neural Networks

The series includes professional expository monographs, advanced textbooks, handbooks, general references, thematic compilations of applications/case studies and carefully edited survey books.

Readership

The publications will appeal to a broad interdisciplinary readership in applied statistics, industrial statistics, quality control, manufacturing, applied reliability, and general quality improvement methods. Graduates, researchers, and practitioners in industry and academia will find the publications accessible presentations and useful resources.

Series Editor: Balakrishnan, N., McMaster University, Hamilton, Canada

Editorial Advisory Board:

Engelhardt, M., EG&G Idaho, Inc., Idaho Falls, ID, USA

Martz, H. F., Los Alamos National Laboratory, Los Alamos, NM, USA

McDonald, G. C., NAO Research & Development Center, Warren, MI, USA

Suzuki, K., University of Electro Communications, Tokyo, Japan

Alerts for this Series

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