Book titles in this series

  1. Lock-in Thermography

    Basics and Use for Evaluating Electronic Devices and Materials

    Authors:
    • Otwin Breitenstein
    • Wilhelm Warta
    • Martin Langenkamp
    • Copyright: 2003

    Available Renditions

    • Hard cover
    • Soft cover
    • eBook
  2. Noise in Semiconductor Devices

    Modeling and Simulation

    Authors:
    • Fabrizio Bonani
    • Giovanni Ghione
    • Copyright: 2001

    Available Renditions

    • Hard cover
    • Soft cover
    • eBook
  3. Cellular Neural Networks

    Chaos, Complexity and VLSI Processing

    Authors:
    • Gabriele Manganaro
    • Paolo Arena
    • Luigi Fortuna
    • Copyright: 1999

    Available Renditions

    • Hard cover
    • Soft cover
    • eBook