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New & Forthcoming Titles | SpringerBriefs in Reliability (Titles in this series)

SpringerBriefs in Reliability

SpringerBriefs in Reliability

Series: SpringerBriefs in Applied Sciences and Technology

Series Editors: Tan, Cher Ming, Fan, Xuejun

ISSN: 2196-1123

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  • Electromigration Modeling at Circuit Layout Level
    • eBook
      download immediately after purchase

      $39.95
      (net)

      Softcover
      usually dispatched within 3 to 5 business days

      $49.95
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    • eBook
      download immediately after purchase

      $39.95
      (net)

      Softcover
      usually dispatched within 3 to 5 business days

      $49.95
      (net)

    Electromigration Modeling at Circuit Layout Level

    Series: SpringerBriefs in Applied Sciences and Technology

    Subseries: SpringerBriefs in Reliability

    Tan, Cher Ming, He, Feifei 2013

    Price from $39.95
    Available Formats:
    Information
    $39.95 (net)
    ISBN 978-981-4451-21-5
    download immediately after purchase
    eBook
    This title is also available as an eBook. You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal. After the purchase you can directly download the eBook file or read it online. Via MySpringer you can always re-download your eBooks.
    Information
    $49.95 (net)
    ISBN 978-981-4451-20-8
    usually dispatched within 3 to 5 business days
    Softcover
    Softcover (also known as softback) version


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