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New & Forthcoming Titles | SpringerBriefs in Reliability (About the Editor)

SpringerBriefs in Reliability

SpringerBriefs in Reliability

Series: SpringerBriefs in Applied Sciences and Technology

Series Editors: Tan, Cher Ming, Fan, Xuejun

ISSN: 2196-1123

A/PROF Tan Cher Ming graduated from the National University of Singapore with 1st class honor in 1984. He received his M.A.Sc and Ph.D in Electrical Engineering from the University of Toronto in 1987 and 1992 respectively. He has 10 years of industrial experiences in electronic industry before joining Nanyang Technological University (NTU) as faculty member in 1996. He has published more than 160 International Journal and Conference papers in the last 10 years, and holding 2 patents and 1 copyright for software, with 2 other patent applications pending. He has also given several keynote speech and invited talks in International conference on electronic reliability. He is the past chair of IEEE Singapore Section, senior member of IEEE, Distinguish Lecturer of IEEE Electronic Device Society, Founding Chair of IEEE Nanotechnology Chapter, Singapore Section, Fellow of Singapore Quality Institute, Senior Scientist in SIMTech and Faculty Associate of IME. He is also the General Chair of IEEE International Conference on Nanoelectronics 2008, General Co-Chair of International Symposium of Integrated Circuits 2007 and 2009, Founding Chair of IEEE International Conference on Emerging Technologies – Nanoelectronics. He is also the Guest Editor of International J. of Nanotechnology. He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, Microelectronic Engineering etc. He is presently the co-author of 5 books and book chapters. He is also the Chief Editor of a statistical optimization book entitled Stimulated Annealing to be published by ARS publishing Co. in 2008.

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