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Physics - Optics & Lasers | Optoelectronics, Instrumentation and Data Processing (Editorial Board)

Optoelectronics, Instrumentation and Data Processing

Optoelectronics, Instrumentation and Data Processing

Editor-in-Chief: Anatolii M. Shalagin

ISSN: 8756-6990 (print version)
ISSN: 1934-7944 (electronic version)

Journal no. 11974

Editor-in-Chief: Anatolii M. Shalagin

EDITORIAL BOARD

EDITOR-IN-CHIEF

Anatolii M. Shalagin (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia)

ASSOCIATE EDITORS

Yu.N. Zolotukhin (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia) and V.K. Malinovsky (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia)

COORDINATING EDITOR

V.P. Bessmeltsev (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia)

EDITORIAL BOARD

A.L. Aseev (Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), S.A. Babin (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), S.M. Borzov (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), I.V. Bychkov (Institute of System Dynamics and Control Theory, Siberian Branch, Russian Academy of Sciences, Irkutsk, Russia), Yu.V. Chugui (Technological Design Institute of Scientific Instrument Engineering, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), G.E. Falkovich (Weizmann Institute of Science, Rehovot, Israel), V.P. Kosykh (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), Yu.N. Kulchin (Far Eastern Branch, Russian Academy of Sciences, Vladivostok, Russia), G.N. Kulipanov (Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), A.V. Latyshev (Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), D.M. Markovich (Kutateladze Institute of Thermophysics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), E.S. Nezhevenko (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), O.I. Potaturkin (Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), Yu.I. Shokin (Institute of Computational Technologies, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia), V.A. Soifer (Institute of Image Processing Systems, Russian Academy of Sciences, Samara, Russia), A.A. Spektor (Novosibirsk State Technical University, Novosibirsk, Russia), and S.K. Turitsyn (Aston Institute of Photonic Technologies, Aston University, Birmingham, UK)

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  • Aims and Scope

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    The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.

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  • Copyright Information

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    Original Russian Edition Copyright © 2010 by Siberian Branch of the Russian Academy of Sciences and the Institute of Automation and Electrometry, SB RAS.

    Copyright © 2010 by Allerton Press, Inc.

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