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Physics - Optics & Lasers | Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials

Fultz, Brent, Howe, James M.

2001, XIX, 748 p.

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  • About this textbook

  • Designed to meet the needs of materials scientists, including students, teachers and researchers
  • It can be used as both an introductory and advanced level graduate text
  • Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
  • Problems for the student are appended to each chapter
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.

Content Level » Graduate

Keywords » Diffraction - Electron microscopy - Imaging - Materials characterization - Spectroscopy - diffraction - imaging - materials characterization - spectroscopy

Related subjects » Condensed Matter Physics - Materials - Optics & Lasers - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

Table of contents 

1. Diffraction and the X-Ray Powder Diffractometer.- 2. The TEM and its Optics.- 3. Scattering.- 4. Inelastic Electron Scattering and Spectroscopy.- 5. Diffraction from Crystals.- 6. Electron Diffraction and Crystallography.- 7. Diffraction Contrast in TEM Images.- 8. Diffraction Lineshapes.- 9. Patterson Functions and Diffuse Scattering.- 10. High-Resolution TEM Imaging.- 11. Dynamical Theory.- Further Reading.- References and Figures.- A. Appendix.- A.1 Indexed Powder Diffraction Patterns.- A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays.- A.3 Atomic Form Factors for X-Rays.- A.4 X-Ray Dispersion Corrections for Anomalous Scattering.- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages.- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp.- A.7 Stereographic Projections.- A.8 Examples of Fourier Transforms.- A.10 Numerical Approximation for the Voigt Function.- A.11 Debye-Waller Factor from Wave Amplitude.- A.12 Review of Dislocations.- A.13 TEM Laboratory Exercises.- A.13.1 Preliminary โ€” JEOL 2000FX Daily Operation.- A.13.2 Preliminary โ€” Philips 400T Daily Operation.- A.13.6 Laboratory 4 โ€” Contrast Analysis of Defects.- A.14 Fundamental and Derived Constants.

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