Logo - springer
Slogan - springer

Physics - Optics & Lasers | Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials

Fultz, Brent, Howe, James M.

2001, XIX, 748 p.


Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.

(net) price for USA

ISBN 978-3-662-04516-9

digitally watermarked, no DRM

Included Format: PDF

download immediately after purchase

learn more about Springer eBooks

add to marked items

  • About this textbook

  • Designed to meet the needs of materials scientists, including students, teachers and researchers
  • It can be used as both an introductory and advanced level graduate text
  • Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
  • Problems for the student are appended to each chapter
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.

Content Level » Graduate

Keywords » Diffraction - Electron microscopy - Imaging - Materials characterization - Spectroscopy - diffraction - imaging - materials characterization - spectroscopy

Related subjects » Condensed Matter Physics - Materials - Optics & Lasers - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

Table of contents 

1. Diffraction and the X-Ray Powder Diffractometer.- 2. The TEM and its Optics.- 3. Scattering.- 4. Inelastic Electron Scattering and Spectroscopy.- 5. Diffraction from Crystals.- 6. Electron Diffraction and Crystallography.- 7. Diffraction Contrast in TEM Images.- 8. Diffraction Lineshapes.- 9. Patterson Functions and Diffuse Scattering.- 10. High-Resolution TEM Imaging.- 11. Dynamical Theory.- Further Reading.- References and Figures.- A. Appendix.- A.1 Indexed Powder Diffraction Patterns.- A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays.- A.3 Atomic Form Factors for X-Rays.- A.4 X-Ray Dispersion Corrections for Anomalous Scattering.- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages.- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp.- A.7 Stereographic Projections.- A.8 Examples of Fourier Transforms.- A.10 Numerical Approximation for the Voigt Function.- A.11 Debye-Waller Factor from Wave Amplitude.- A.12 Review of Dislocations.- A.13 TEM Laboratory Exercises.- A.13.1 Preliminary โ€” JEOL 2000FX Daily Operation.- A.13.2 Preliminary โ€” Philips 400T Daily Operation.- A.13.6 Laboratory 4 โ€” Contrast Analysis of Defects.- A.14 Fundamental and Derived Constants.

Popular Content within this publication 



Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Spectroscopy and Microscopy.

Additional information