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Physics - Optics & Lasers | Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Authors and Editors)

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin

Originally published under: Breitenstein, O.; Langenkamp, M. and with the title "Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components"

2nd ed. 2010, X, 258 p.

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Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials analysis by electron microscopic and IR-based methods. Wilhelm Warta studied Physics at Würzburg and then Stuttgart University, where he graduated and received his PhD with research on charge transport properties of organic molecular crystals. 1985 he joined Fraunhofer Institute for Solar Energy Systems in Freiburg starting with work on carrier lifetime measurement techniques for semiconductor materials. His fields are the development of measurement techniques for solar cell development, characterization of solar cell material and solar cells, device and process simulation as well as high precision calibration of solar cells.

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  • Lock-in Thermography
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    Lock-in Thermography

    Basics and Use for Evaluating Electronic Devices and Materials

    Series: Springer Series in Advanced Microelectronics, Vol. 10

    Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin 2010

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    Lock-in Thermography

    Basics and Use for Evaluating Electronic Devices and Materials

    Series: Springer Series in Advanced Microelectronics, Vol. 10

    Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin 2003, or go to the Latest Edition

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