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Physics - Optics & Lasers | Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Breitenstein, Otwin, Warta, Wilhelm, Langenkamp, Martin

Originally published under: Breitenstein, O.; Langenkamp, M. and with the title "Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components"

2nd ed. 2010, X, 258 p.

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  • Only book on the market dedicated to this highly sensitive infrared measurement method
  • Explains the basics and applications of this analytical technique
  • A reference work for researchers and engineers alike
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.

Content Level » Research

Keywords » Failure analysis - Lifetime mapping - Shunt imaging - Solar cell characterization - Trap density mapping - diagnosis - thermography

Related subjects » Characterization & Evaluation of Materials - Engineering - Optics & Lasers - Structural Materials

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