2014, XVIII, 356 p. 254 illus., 107 illus. in color.
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Gives a description of the main instrumental influences on the analytical performance
Discusses the different quantification models of X-ray measurements considering the special requirements to the analysis of non-homogeneous materials
Supplies an overview of X-ray fluorescence applications with various suggestions for the use of the analytical potential of this method
Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
Content Level »Research
Keywords »Components of X-ray Spectrometers - Distribution Analysis - Examination of Bulk Samples and Layer Systems - Micro-X-ray Fluorescence - Non-destructive Analysis - Single Point, Multi-dimensional and - Spatial Resolved Element Analysis - X-Ray Spectrometers