Advanced Computing in Electron Microscopy

1. Front Matter

   Pages i-x

   PDF

2. Introduction

   • Earl J. Kirkland

   Pages 1-4

3. The Transmission Electron Microscope

   • Earl J. Kirkland

   Pages 5-27

4. Linear Image Approximations

   • Earl J. Kirkland

   Pages 29-60

5. Sampling and the Fast Fourier Transform

   • Earl J. Kirkland

   Pages 61-76

6. Calculation of Images of Thin Specimens

   • Earl J. Kirkland

   Pages 77-113

7. Theory of Calculation of Images of Thick Specimens

   • Earl J. Kirkland

   Pages 115-161

8. Multislice Applications and Examples

   • Earl J. Kirkland

   Pages 163-197

9. The Programs

   • Earl J. Kirkland

   Pages 199-231

10. Plotting Transfer Functions

    • Earl J. Kirkland

    Pages 233-240

11. The Fourier Projection Theorem

    • Earl J. Kirkland

    Pages 241-242

12. Atomic Potentials and Scattering Factors

    • Earl J. Kirkland

    Pages 243-260

13. Bilinear Interpolation

    • Earl J. Kirkland

    Pages 261-263

14. 3D Perspective View

    • Earl J. Kirkland

    Pages 265-269

15. Back Matter

    Pages 287-289

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Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/˜kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

• computer simulation
• electron microscopy
• fast fourier projection theorem
• fast fourier transform
• multislice methods
• scanning transmission electron microscope
• theory of electron image formation
• transmission electron microscopy

From the reviews of the second edition:

“It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)

• School of Applied and Engineering Physic, Cornell University, Ithaca, USA

  Earl J. Kirkland

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