Authors:
- Designed to meet the needs of materials scientists, including students, teachers and researchers
- It can be used as both an introductory and advanced level graduate text
- Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
- Problems for the student are appended to each chapter
- Includes supplementary material: sn.pub/extras
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (11 chapters)
-
Front Matter
-
Back Matter
About this book
Authors and Affiliations
-
Division of Engineering and Applied Science, California Institute of Technology, Pasadena, USA
Brent Fultz
-
Department of Materials Science and Engineering, University of Virginia, Charlottesville, USA
James M. Howe
Bibliographic Information
Book Title: Transmission Electron Microscopy and Diffractometry of Materials
Authors: Brent Fultz, James M. Howe
DOI: https://doi.org/10.1007/978-3-662-04516-9
Publisher: Springer Berlin, Heidelberg
-
eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2001
eBook ISBN: 978-3-662-04516-9Published: 21 November 2013
Edition Number: 1
Number of Pages: XIX, 748
Topics: Spectroscopy and Microscopy, Surface and Interface Science, Thin Films, Solid State Physics, Surfaces and Interfaces, Thin Films