Authors:
- Only book in the market on this highly sensitive infrared measurement method
- Explains the basics and applications of this analytical technique
- A reference work for researchers and engineers alike
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 10)
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Table of contents (7 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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MPI für Mikrostrukturphysik, Halle, Germany
Otwin Breitenstein
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Solare Energiesysteme (ISE), Fraunhofer-Institut für, Freiburg, Germany
Wilhelm Warta
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Rendsburg, Germany
Martin Langenkamp
About the authors
Bibliographic Information
Book Title: Lock-in Thermography
Book Subtitle: Basics and Use for Evaluating Electronic Devices and Materials
Authors: Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
Series Title: Springer Series in Advanced Microelectronics
DOI: https://doi.org/10.1007/978-3-642-02417-7
Publisher: Springer Berlin, Heidelberg
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2010
Hardcover ISBN: 978-3-642-02416-0Published: 05 September 2010
eBook ISBN: 978-3-642-02417-7Published: 05 September 2010
Series ISSN: 1437-0387
Series E-ISSN: 2197-6643
Edition Number: 2
Number of Pages: X, 258
Number of Illustrations: 56 b/w illustrations, 33 illustrations in colour
Additional Information: Originally published under: Breitenstein, O.; Langenkamp, M. and with the title "Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components"
Topics: Optics, Lasers, Photonics, Optical Devices, Characterization and Evaluation of Materials, Engineering, general, Structural Materials