Surface Analysis Methods in Materials Science

1. Front Matter

   Pages I-XXI

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2. Introduction

   1. Front Matter

      Pages 1-1

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   2. Solid Surfaces, Their Structure and Composition

      • C. Klauber, R. St. C. Smart

      Pages 3-65

   3. UHV Basics

      • C. Klauber

      Pages 67-76

3. Techniques

   1. Front Matter

      Pages 77-77

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   2. Electron Microscope Techniques for Surface Characterization

      • P. S. Turner

      Pages 79-96

   3. Sputter Depth Profiling

      • B. V. King

      Pages 97-116

   4. SIMS — Secondary Ion Mass Spectrometry

      • R. J. MacDonald, B. V. King

      Pages 117-147

   5. Auger Spectroscopy and Scanning Auger Microscopy

      • R. Browning

      Pages 149-164

   6. X-Ray Photoelectron Spectroscopy

      • M. H. Kibel

      Pages 165-186

   7. Fourier Transform Infrared Spectroscopy of Surfaces

      • N. K. Roberts

      Pages 187-201

   8. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

      • S. H. Sie

      Pages 203-219

   9. Scanning Tunnelling Microscopy

      • B. A. Sexton

      Pages 221-244

   10. Low Energy Ion Scattering

       • D. J. O’Connor

       Pages 245-262

   11. Reflection High Energy Electron Diffraction

       • G. L. Price

       Pages 263-274

   12. Low Energy Electron Diffraction

       • P. J. Jennings

       Pages 275-289

   13. Ultraviolet Photoelectron Spectroscopy of Solids

       • R. Leckey

       Pages 291-300

   14. Spin Polarized Electron Techniques

       • J. L. Robins

       Pages 301-316

4. Processes and Applications

   1. Front Matter

      Pages 317-317

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   2. Materials Technology

      • R. St. C. Smart

      Pages 319-336

The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica­ tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur­ face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter­ ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University.

• UPS
• catalysis
• electron spectroscopy
• film
• materials engineering
• materials science
• oxidation
• semiconductor
• solar cell
• spectroscopy
• surface
• surface analysis
• surface physics
• surface science
• thin films

• Department of Physics, Newcastle University, Callaghan, Newcastle, Australia

  D. John O’Connor

• CSIRO Division of Materials Science and Technology, Clayton, Australia

  Brett A. Sexton

• South Australian Surface Technology Centre, University of South Australia, The Levels, Adelaide, Australia

  Roger St. C. Smart

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