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Physics - Condensed Matter Physics | In-situ Materials Characterization - Across Spatial and Temporal Scales

In-situ Materials Characterization

Across Spatial and Temporal Scales

Ziegler, A., Graafsma, H., Zhang, X.F., Frenken, J.W.M. (Eds.)

2014, XI, 256 p. 124 illus., 78 illus. in color.

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  • - scientific status report on analytical techniques in nano-and surface sciences - presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy - presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.

Content Level » Graduate

Keywords » In-situ characterization - Material dynamics - Nanoanalysis - Nanoscale materials - Neutron scattering - Photoelectron spectroscopy - Scanning probe techniques - Structure-property - Ultra-fast analysis - X-ray absorption spectroscopy

Related subjects » Characterization & Evaluation of Materials - Condensed Matter Physics - Nanotechnology - Optics & Lasers - Structural Materials - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

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