Logo - springer
Slogan - springer

Physics - Condensed Matter Physics | Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry of Functional Organic Surfaces and Films

Hinrichs, Karsten, Eichhorn, Klaus-Jochen (Eds.)

2014, XXI, 363 p. 216 illus., 55 illus. in color.

Available Formats:

Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.


(net) price for USA

ISBN 978-3-642-40128-2

digitally watermarked, no DRM

Included Format: PDF and EPUB

download immediately after purchase

learn more about Springer eBooks

add to marked items


Hardcover version

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.


(net) price for USA

ISBN 978-3-642-40127-5

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days

add to marked items

  • Provides a state of the art report of the technique of ellipsometry
  • Presents recent developments in ellipsometric real-time/in-situ monitoring techniques
  • Is oriented towards the high technological interest in the characterization of functional organic films and surfaces
  • Includes the collection of optical constants
  • Written by leading scientists
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Content Level » Research

Keywords » Biomolecules at Surfaces - Characterization of Organic Semiconductors for OPV, - Ellipsometric Real-time/In-situ Monitoring Techniques - Functional and Smart Films - Infrared Brillant Light Sources for Micro-ellipsometric Studies - Nanostructured Surfaces - OLEDs and OTFT - Optical Constants - Optical Constants of Organic Layers - Organic and Hybrid Materials - Smart Polymer Surfaces and Films

Related subjects » Characterization & Evaluation of Materials - Condensed Matter Physics - Optics & Lasers - Physical Chemistry - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

Table of contents / Preface / Sample pages 

Popular Content within this publication 



Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Surface and Interface Science, Thin Films.