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Physics - Condensed Matter Physics | Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry of Functional Organic Surfaces and Films

Hinrichs, Karsten, Eichhorn, Klaus-Jochen (Eds.)

2014, XXI, 363 p. 216 illus., 55 illus. in color.

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  • Provides a state of the art report of the technique of ellipsometry
  • Presents recent developments in ellipsometric real-time/in-situ monitoring techniques
  • Is oriented towards the high technological interest in the characterization of functional organic films and surfaces
  • Includes the collection of optical constants
  • Written by leading scientists
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Content Level » Research

Keywords » Biomolecules at Surfaces - Characterization of Organic Semiconductors for OPV, - Ellipsometric Real-time/In-situ Monitoring Techniques - Functional and Smart Films - Infrared Brillant Light Sources for Micro-ellipsometric Studies - Nanostructured Surfaces - OLEDs and OTFT - Optical Constants - Optical Constants of Organic Layers - Organic and Hybrid Materials - Smart Polymer Surfaces and Films

Related subjects » Characterization & Evaluation of Materials - Condensed Matter Physics - Optics & Lasers - Physical Chemistry - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

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