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Physics - Condensed Matter Physics | Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Bhushan, Bharat (Ed.)

2012, XX, 630 p. 373 illus., 269 illus. in color.

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  • Summarizes the currrent state of the art in scanning probe microscoopy techniques
  • Contains strong part on biological applications
  • Contributions by leading researchers and application scientists from all over the world and from various industries provide a broader perspective
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Content Level » Research

Keywords » High-speed AFM imaging - SNOM - atomic force microscopy - biological nanocharacterization - biomimetics - overview of SPM applications - scanning probe microscopy - scanning tunneling microscopy - spectroscopic techniques in SPM

Related subjects » Biomaterials - Biomedical Engineering - Characterization & Evaluation of Materials - Condensed Matter Physics - Engineering - Nanotechnology

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