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Impurities and Defects in Group IV Elements and III-V Compounds / Störstellen und Defekte in Elementen der IV. Gruppe und III-V-Verbindungen

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Authors:
  1. C.A.J. Ammerlaan
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  2. W. Bergholz
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  3. B. Clerjaud
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  4. H. Ennen
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  5. H.G. Grimmeiss
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  6. B. Hamilton
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  7. U. Kaufmann
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  8. W.v. Münch
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  9. R. Murray
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  10. R.C. Newman
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  11. A.R. Peaker
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  12. G. Pensl
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  13. H.-J. Rath
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  14. R. Sauer
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  15. J. Schneider
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  16. M. Schulz
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  17. M.S. Skolnick
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  18. N.A. Stolwijk
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  19. P. Vogl
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  20. A.F.W. Willoughby
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  21. W. Zulehner
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Editors:
  1. Max Schulz
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Part of the book series: Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology - New Series (LANDOLT 3, volume 22b)

Part of the book sub series: Condensed Matter (LANDOLT 3)

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Keywords

  • Bindungen
  • defects
  • semiconductor

About this book

Subvolume III/22b of the Landolt-Börnstein New Series presents a comprehensive data compilation on defects and impurities in the elemental semiconductors and in the III-V compounds. Data on semiconductor defects were already included in the extended data collection on semiconductors in volumes III/17a...i. Research on semiconductor defects and impurities, however, advanced so rapidly during recent years that a new subvolume on this important topic seemed desirable. The information given in subvolume III/22b ranges from trends on defect properties as predicted by theory and a survey of diagnostic techniques to extensive tables and graphical representations of defect properties. The editor and the authors have endeavoured to find a unified form and to critically select the important and reliable information from the wide range of published data. Discussions of ambiguous results or textbook style explanations are avoided.

Bibliographic Information

  • Book Title: Impurities and Defects in Group IV Elements and III-V Compounds / Störstellen und Defekte in Elementen der IV. Gruppe und III-V-Verbindungen

  • Authors: C.A.J. Ammerlaan, W. Bergholz, B. Clerjaud, H. Ennen, H.G. Grimmeiss, B. Hamilton, U. Kaufmann, W.v. Münch, R. Murray, R.C. Newman, A.R. Peaker, G. Pensl, H.-J. Rath, R. Sauer, J. Schneider, M. Schulz, M.S. Skolnick, N.A. Stolwijk, P. Vogl, A.F.W. Willoughby, … W. Zulehner

  • Editors: Max Schulz

  • Series Title: Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology - New Series

  • Publisher: Springer Berlin, Heidelberg

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1989

  • Hardcover ISBN: 978-3-540-17917-7Due: 12 December 1989

  • eBook ISBN: 978-3-540-47930-7

  • Series ISSN: 1615-1844

  • Series E-ISSN: 1616-9522

  • Edition Number: 1

  • Number of Pages: XX, 776

  • Number of Illustrations: 812 b/w illustrations

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