Logo - springer
Slogan - springer

Physics - Applied & Technical Physics | Theoretical Concepts of X-Ray Nanoscale Analysis - Theory and Applications

Theoretical Concepts of X-Ray Nanoscale Analysis

Theory and Applications

Benediktovitch, Andrei, Feranchuk, Ilya, Ulyanenkov, Alexander

2014, XIII, 318 p. 108 illus., 37 illus. in color.

Available Formats:
eBook
Information

Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.

 
$139.00

(net) price for USA

ISBN 978-3-642-38177-5

digitally watermarked, no DRM

Included Format: PDF and EPUB

download immediately after purchase


learn more about Springer eBooks

add to marked items

Hardcover
Information

Hardcover version

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$179.00

(net) price for USA

ISBN 978-3-642-38176-8

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

  • Gives a state-of-the-art report of the understanding of X-ray scattering and diffraction
  • Contains theoretical methods for a wide range of X-ray materials research
  • Includes detailed explanations of theoretical models and approaches
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Content Level » Research

Keywords » X-ray polarizability - X-ray powder diffraction - X-ray reflectivity book - X-ray spectroscopy - X-ray theory explained - dynamical theory of diffraction - grazing-incidence diffraction - materials analysis - theory of X-ray diffraction in crystals - x-ray diffraction theory

Related subjects » Applied & Technical Physics - Characterization & Evaluation of Materials - Optics & Lasers - Theoretical, Mathematical & Computational Physics

Table of contents / Preface / Sample pages 

Popular Content within this publication 

 

Articles

Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Measurement Science, Instrumentation.