Overview
Gives an introduction to quantum effects in metrology and quantum electronics
Explains standards for quantum measurements
Contains many applications and exercises for electrical quantities, mass, length, time and frequency
Includes supplementary material: sn.pub/extras
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Table of contents (12 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
Authors and Affiliations
Bibliographic Information
Book Title: Introduction to Quantum Metrology
Book Subtitle: Quantum Standards and Instrumentation
Authors: Waldemar Nawrocki
DOI: https://doi.org/10.1007/978-3-319-15669-9
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing Switzerland 2015
Softcover ISBN: 978-3-319-38479-5Published: 09 October 2016
eBook ISBN: 978-3-319-15669-9Published: 24 March 2015
Edition Number: 1
Number of Pages: XIII, 279
Number of Illustrations: 111 b/w illustrations, 23 illustrations in colour
Additional Information: Original Polish edition published by Wydawnictwo Politechniki Poznańskiej, Poznań, 2007
Topics: Measurement Science and Instrumentation, Nanoscale Science and Technology, Nanotechnology and Microengineering, Electronics and Microelectronics, Instrumentation