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New Horizons of Applied Scanning Electron Microscopy

  • Book
  • © 2010

Overview

Authors:
  1. Kenichi Shimizu

    1. University Chemical Laboratory, Keio University, Yokohama, Kanagawa, Japan

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  2. Tomoaki Mitani

    1. Fac. Science & Technology, Central Facilities for Research, Keio University, Yokohama, Kanagawa, Japan

    View author publications

    You can also search for this author in PubMed   Google Scholar

  • Presents a new technique to significantly improve in resolution and extent the applicational field of scanning electron microscopy
  • Covers physics, sample preparation and technical aspects
  • Offers many insights and hints based on the authors' excellent experimental experience
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 45)

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Table of contents (41 chapters)

  1. Front Matter

    Pages I-XIV
    Download chapter PDF

  2. Introduction

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 1-2

  3. Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 3-6

  4. Application Example 2: Z-Contrast Sensitivity in Low-Voltage, High-Angle BSE Imaging

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 7-10

  5. Application Example 3: Information Depth in Low-Voltage, High-Angle BSE Imaging

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 11-12

  6. Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications – Further Evidence for High Lateral Resolution in Low-Voltage, High-Angle BSE Imaging

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 13-16

  7. Application Example 5: A Thin Layer of Organic Contaminant on the Surface of Mirror-Polished Al-Based Hard Disks

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 17-19

  8. Application Example 6: A Further Potential of Ultralow-Voltage In-lens SE Imaging

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 21-22

  9. Application Example 7: Sample Surface Preparation by Ultramicrotomy Using a Diamond Knife for Cross-Sectional Examination of Various Coatings on Metals

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 23-24

  10. Application Example 8: Cross-Sectional Examination of a Galvanized Steel

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 25-27

  11. Application Example 9: Cross-Sectional Examination of a Painted Steel

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 29-30

  12. Application Example 10: Cross-Sectional Examination of Solder Joint of the Printed Circuit Board

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 31-32

  13. Application Example 11: Cross-Sectional Examination of a Tin-Plated Copper Sheet for Electronic Application

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 33-35

  14. Application Example 12: Cross-Sectional Examination of an Anodized Aluminum Alloy for Aerospace Application

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 37-38

  15. Application Example 13: Cross-Sectional Examination of a Porous Anodic Oxide Film Grown on a Heterogeneous Al-Fe Alloy

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 39-40

  16. Application Example 14: Corrosion of an Al 2024-T3 Alloy for Aerospace Application

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 41-43

  17. Application Example 15: Cross-Sectional Examination of an Etched Al Foil for Capacitor Application

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 45-48

  18. Application Example 16: On the Nature of rf-GD Sputtering

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 49-51

  19. Application Example 17: On the Surface Damages Associated with rf-GD Sputtering

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 53-55

  20. Application Example 18: Precipitates in a Stainless Steel

    • Kenichi Shimizu, Tomoaki Mitani
    Pages 57-60
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Keywords

About this book

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Reviews

From the reviews:

“The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)

Authors and Affiliations

  • University Chemical Laboratory, Keio University, Yokohama, Kanagawa, Japan

    Kenichi Shimizu

  • Fac. Science & Technology, Central Facilities for Research, Keio University, Yokohama, Kanagawa, Japan

    Tomoaki Mitani

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