Overview
- Provides a comprehensive and invaluable overview of the basics of crystallographic textures and their industrial applications
- Introduces the existing methods of representation in an accessible manner and presents a thorough overview of existing knowledge on texture of metallic materials
- Constitutes an invaluable reference text for researchers and professionals working on texture analysis in metallurgy, materials science and engineering, physics and geology
- Includes supplementary material: sn.pub/extras
Part of the book series: Engineering Materials and Processes (EMP)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (10 chapters)
-
Front Matter
-
Back Matter
Keywords
About this book
Providing a comprehensive and invaluable overview of the basics of crystallographic textures and their industrial applications, this book covers a broad range of both structural and functional materials. It introduces the existing methods of representation in an accessible manner and presents a thorough overview of existing knowledge on texture of metallic materials.
Texture analysis has widespread use in many industries, and provides crucial input towards the development of new materials and products. There has been rapid growth in the science and art of texture analysis in the last few decades. Other topics addressed within this book include recent research on texture in thin films and non-metals, and the dependence of material properties on texture, and texture control in some engineering materials.
This book constitutes an invaluable reference text for researchers and professionals working on texture analysis in metallurgy, materials science and engineering, physics and geology. By using content selectively, it is also highly accessible to undergraduate students.
Authors and Affiliations
About the authors
Satyam Suwas is an Associate Professor of Materials Engineering at the Indian Institute of Science (I.I.Sc.) Bangalore, India. He obtained his Ph.D. from Indian Institute of Technology, Kanpur, India. Prior to joining I.I.Sc., he worked briefly at Defence Metallurgical Research Laboratory Hyderabad as a Scientist, at University of Metz in France as a Visiting Faculty and at RWTH Aachen in Germany as an Alexander von Humboldt Fellow. His research interests are crystallographic texture evolution and grain boundary engineering in structural and functional materials. He has published over 140 papers in international journals and conference proceedings.
Ranjit Kumar Ray was a Professor of Metallurgical Engineering at the Indian Institute of Technology (I.I.T.) Kanpur, India from where he retired after several decades of distinguished teaching and research career. He obtained his Ph.D. from the University of Birmingham, UK. He was an Alexander von Humboldt Fellow at RWTH Aachen and NSERC Fellow at McGill University, Canada. He has over 200 technical publications in international journals and conference proceedings to his credit. He is currently serving as a Visiting Scientist, Tata Steel Jamshedpur. His research interests are texture-microstructure-property correlations in materials, particularly steels.
Bibliographic Information
Book Title: Crystallographic Texture of Materials
Authors: Satyam Suwas, Ranjit Kumar Ray
Series Title: Engineering Materials and Processes
DOI: https://doi.org/10.1007/978-1-4471-6314-5
Publisher: Springer London
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag London 2014
Hardcover ISBN: 978-1-4471-6313-8Published: 26 August 2014
Softcover ISBN: 978-1-4471-6861-4Published: 10 September 2016
eBook ISBN: 978-1-4471-6314-5Published: 14 August 2014
Series ISSN: 1619-0181
Series E-ISSN: 2365-0761
Edition Number: 1
Number of Pages: XIII, 260
Number of Illustrations: 152 b/w illustrations, 5 illustrations in colour
Topics: Metallic Materials, Solid Mechanics, Structural Materials, Surfaces and Interfaces, Thin Films, Characterization and Evaluation of Materials, Crystallography and Scattering Methods