Editors:
- Provides the first comprehensive treatment of the physics and applications of this mainstream technique for imaging and analysis at the atomic level
- Presents applications of STEM in condensed matter physics, materials science, catalysis, and nanoscience
- Suitable for graduate students learning microscopy, researchers wishing to utilize STEM, as well as for specialists in other areas of microscopy
- Edited and written by leading researchers and practitioners
- Includes supplementary material: sn.pub/extras
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Table of contents (18 chapters)
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Front Matter
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Back Matter
About this book
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Reviews
From the reviews:
“To describe in 18 chapters the current status in a wide field, a dazzling list of no less than 44 distinguished authors has been assembled. Fortunately, the role of the editors has continued well beyond the point of producing their own chapters to ensure that these different contributions are reasonably well integrated with a useful index….The editors’ assertion that the experiment of focusing a beam of electrons down to an atomic scale and measuring its scattering has spectacular outcomes is most abundantly proved here.”
--Archie Howie, Microscopy and Microanalysis
“The book opens with a magnificent 90-page history of STEM by S.J. Pennycook, which traces the story of the instrument from von Ardenne’s microscope of the late 1930s to such very recent innovations as the confocal mode of operation. … Very readable, lavishly illustrated and extremely thorough, this will remain a key publication on the history of the STEM.” (Ultramicroscopy, Vol. 116, 2012)
Editors and Affiliations
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Oak Ridge National Laboratory, Oak Ridge, USA
Stephen J. Pennycook
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, Department of Materials, University of Oxford, Oxford, United Kingdom
Peter D. Nellist
About the editors
Bibliographic Information
Book Title: Scanning Transmission Electron Microscopy
Book Subtitle: Imaging and Analysis
Editors: Stephen J. Pennycook, Peter D. Nellist
DOI: https://doi.org/10.1007/978-1-4419-7200-2
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media, LLC 2011
Hardcover ISBN: 978-1-4419-7199-9Published: 22 March 2011
eBook ISBN: 978-1-4419-7200-2Published: 24 March 2011
Edition Number: 1
Number of Pages: XII, 762
Topics: Optical and Electronic Materials, Characterization and Evaluation of Materials, Biological Microscopy, Solid State Physics, Condensed Matter Physics, Nanotechnology